JAMB reschedules 2019 examinations

We need your support to produce excellent journalism at all times.

The Joint Admissions and Matriculation Board, JAMB, has rescheduled the mock test for its candidates, which was initially slated for Saturday, 23rd March, to hold on Monday, April 1.

JAMB’s spokesperson Fabian Benjamin said in a statement that the change in dates for the preparatory examinations by the board was “beyond their control”.

He said the candidates who had indicated interest in the mock examination at the point of registration and have since printed their mock examination notification slips need not print another one.

“All the details on the slips remain the same except the mock examination date which is now 1st April.

“JAMB had closed the sale of its Unified Tertiary Matriculation Examination, UTME, and Direct Entry, DE, application document on 21st February. At the close of the sale and subsequently close of registration portal, it was discovered that 41,063 candidates created a profile and procured either  UTME or DE ePINS but were unable to complete their registration formalities after initiating the process.

“We are considering to open the registration portal effective from Wednesday 13th March, for all candidates with either UTME or DE ePINS to complete their registration formalities. The portal would be closed on Friday, 15th March, by 12midnight.

“All candidates who registered for the 2019 UTME are to ensure that they print their examination notification slips before the day of the examination as no excuses would be entertained. The public should note that the Board would not reschedule examination for any candidate,” the statement reads.

The Board has also scheduled the 2019 Unified Tertiary Matriculation Examination (UTME)  for Thursday, 11th April.

Candidates are to begin the printing of the 2019 UTME notification slips from Tuesday,2nd April, the board said.


This website uses cookies to improve your experience. We'll assume you're ok with this, but you can opt-out if you wish. Accept Read More